专利名称：System, method, and software for testing
electrical devices
发明人：Kurt A. Witte,Andrea J. Wright申请号：US10986431申请日：20041112公开号：US07030794B2公开日：20060418
专利附图：
摘要：A method according to a first aspect may include performing a first analog-to-digital (A/D) conversion using an A/D converter. Data associated with this first A/Dconversion may be read using a processor. A command may then be issued from a
processor when the reading of the data has started. This command may instruct the A/Dconverter to perform a second A/D conversion. This data may then be stored in a datastructure located within a memory device while the A/D converter is performing thesecond A/D conversion. In addition to performing such pipelined A/D conversions, thepresent invention may include a system, method and software for filtering out noise in avoltage measurement after the voltage measurement has been converted to a digitalsignal by omitting the highest and lowest voltage values and averaging the remainder ofthe voltage values, thereby reducing noise in the voltage measurements.
申请人：Kurt A. Witte,Andrea J. Wright
地址：Minnetonka MN US,Minneapolis MN US
国籍：US,US
代理机构：Howrey LLP
代理人：Michael J. Bell
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